Raman spectroscopy of nanocrystalline and amorphous GaN
نویسندگان
چکیده
منابع مشابه
Point Defects in Amorphous and Nanocrystalline Fluorinated Silicon Films
Nanocrystalline fluorinated silicon films are studied by using Raman spectroscopy, electron paramagnetic resonance, Fourier-transformed infrared spectroscopy, atomic force microscopy, nonlinear laser spectroscopy, and photoluminescence. Electrical properties of nanocrystalline silicon and amorphous silicon films were compared. The field-assisted migration of point defects is dramatic for durabi...
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